%0 Conference Paper %1 conf/ats/TakahashiBTM97 %A Takahashi, Hiroshi %A Boateng, Kwame Osei %A Takamatsu, Yuzo %A Matsunaga, Toshiyuki %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 320-325 %T A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#TakahashiBTM97 %@ 0-8186-8209-4

@inproceedings{conf/ats/TakahashiBTM97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Takahashi, Hiroshi and Boateng, Kwame Osei and Takamatsu, Yuzo and Matsunaga, Toshiyuki}, biburl = {https://www.bibsonomy.org/bibtex/2cce3107f592f12e27ad670147350d551/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643977}, interhash = {d0ae55d07171d9f93657a8ce37a58352}, intrahash = {cce3107f592f12e27ad670147350d551}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {320-325}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#TakahashiBTM97}, year = 1997 }