Аннотация
In this work we extend the study of the use of Raman spectroscopy to
characterize graphitic foams by analyzing the dependence of the G band
lineshape on both the excitation laser energy and on the topology of the
studied area. The G' band lineshape was found to be strongly correlated
with the presence of stacking faults. The contribution of the TO + LA
combination mode at similar to 2450 cm(-1) to the evaluated skewness
includes an excitation energy dependence which needs to be considered.
We analyze how to take this effect into consideration, thus obtaining a
good evaluation of the dependence of the skewness of the G band on the
presence of stacking faults. We also discuss the correlation between the
presence of stacking faults and of in plane defects in graphitic foams.
(c) 2007 Elsevier B.V. All rights reserved.
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