%0 Journal Article %1 journals/dt/AntoninOK91 %A Antonin, Georg %A Oberle, Hans-Dieter %A Kölzer, Jochen %D 1991 %J IEEE Des. Test Comput. %K dblp %N 3 %P 36-43 %T Electrical Characterization of Megabit DRAMs, Part 1: External Testing. %U http://dblp.uni-trier.de/db/journals/dt/dt8.html#AntoninOK91 %V 8

@article{journals/dt/AntoninOK91, added-at = {2020-05-26T00:00:00.000+0200}, author = {Antonin, Georg and Oberle, Hans-Dieter and Kölzer, Jochen}, biburl = {https://www.bibsonomy.org/bibtex/2ba162e9c952752987409ed45e0d4b971/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/54.84242}, interhash = {d54e757fa317b5f977a02f7c7f7935d2}, intrahash = {ba162e9c952752987409ed45e0d4b971}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 3, pages = {36-43}, timestamp = {2020-05-27T11:44:56.000+0200}, title = {Electrical Characterization of Megabit DRAMs, Part 1: External Testing.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt8.html#AntoninOK91}, volume = 8, year = 1991 }