%0 Conference Paper %1 Gockel:1997:GAsctg %A Gockel, Nicole %A Keim, Martin %A Drechsler, Rolf %A Becker, Bernd %B Genetic Programming 1997: Proceedings of the Second Annual Conference %C Stanford University, CA, USA %D 1997 %E Koza, John R. %E Deb, Kalyanmoy %E Dorigo, Marco %E Fogel, David B. %E Garzon, Max %E Iba, Hitoshi %E Riolo, Rick L. %I Morgan Kaufmann %K Algorithms Genetic %P 363--369 %T A Genetic Algorithm for Sequential Circuit Test Generation based on Symbolic Fault Simulation

@inproceedings{Gockel:1997:GAsctg, added-at = {2008-06-19T17:35:00.000+0200}, address = {Stanford University, CA, USA}, author = {Gockel, Nicole and Keim, Martin and Drechsler, Rolf and Becker, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/2d52a7ba52adc088aa8c71f99520ae915/brazovayeye}, booktitle = {Genetic Programming 1997: Proceedings of the Second Annual Conference}, editor = {Koza, John R. and Deb, Kalyanmoy and Dorigo, Marco and Fogel, David B. and Garzon, Max and Iba, Hitoshi and Riolo, Rick L.}, interhash = {da88449f6d370522f3c08b132462ee8b}, intrahash = {d52a7ba52adc088aa8c71f99520ae915}, keywords = {Algorithms Genetic}, month = {13-16 July}, notes = {GP-97}, pages = {363--369}, publisher = {Morgan Kaufmann}, publisher_address = {San Francisco, CA, USA}, timestamp = {2008-06-19T17:40:22.000+0200}, title = {A Genetic Algorithm for Sequential Circuit Test Generation based on Symbolic Fault Simulation}, year = 1997 }