%0 Conference Paper %1 conf/ddecs/WaliTV0BB17 %A Wali, Imran %A Traiola, Marcello %A Virazel, Arnaud %A Girard, Patrick %A Barbareschi, Mario %A Bosio, Alberto %B DDECS %D 2017 %E Dietrich, Manfred %E Novák, Ondrej %I IEEE %K dblp %P 28-33 %T Towards approximation during test of Integrated Circuits. %U http://dblp.uni-trier.de/db/conf/ddecs/ddecs2017.html#WaliTV0BB17 %@ 978-1-5386-0472-4

@inproceedings{conf/ddecs/WaliTV0BB17, added-at = {2020-09-05T00:00:00.000+0200}, author = {Wali, Imran and Traiola, Marcello and Virazel, Arnaud and Girard, Patrick and Barbareschi, Mario and Bosio, Alberto}, biburl = {https://www.bibsonomy.org/bibtex/2641ae9b93c4da6dcd0664c1d10f7ad87/dblp}, booktitle = {DDECS}, crossref = {conf/ddecs/2017}, editor = {Dietrich, Manfred and Novák, Ondrej}, ee = {https://doi.org/10.1109/DDECS.2017.7934574}, interhash = {e2158056eada327c7e923442ae40ee39}, intrahash = {641ae9b93c4da6dcd0664c1d10f7ad87}, isbn = {978-1-5386-0472-4}, keywords = {dblp}, pages = {28-33}, publisher = {IEEE}, timestamp = {2020-09-09T14:25:26.000+0200}, title = {Towards approximation during test of Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ddecs/ddecs2017.html#WaliTV0BB17}, year = 2017 }