%0 Conference Paper %1 conf/ets/NiewenhuisMB17 %A Niewenhuis, Ben %A Mittal, Soumya %A Blanton, R. D. (Shawn) %B ETS %D 2017 %I IEEE %K dblp %P 1-6 %T Multiple-defect diagnosis for Logic Characterization Vehicles. %U http://dblp.uni-trier.de/db/conf/ets/ets2017.html#NiewenhuisMB17 %@ 978-1-5090-5457-2

@inproceedings{conf/ets/NiewenhuisMB17, added-at = {2017-07-13T00:00:00.000+0200}, author = {Niewenhuis, Ben and Mittal, Soumya and Blanton, R. D. (Shawn)}, biburl = {https://www.bibsonomy.org/bibtex/239154ed9c4f1ff3e57ad38cc7f2e8209/dblp}, booktitle = {ETS}, crossref = {conf/ets/2017}, ee = {https://doi.org/10.1109/ETS.2017.7968231}, interhash = {e321e02cdc73f0b5935fcf8aea786d4f}, intrahash = {39154ed9c4f1ff3e57ad38cc7f2e8209}, isbn = {978-1-5090-5457-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T15:59:11.000+0200}, title = {Multiple-defect diagnosis for Logic Characterization Vehicles.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2017.html#NiewenhuisMB17}, year = 2017 }