%0 Conference Paper %1 conf/ets/Maxwell07 %A Maxwell, Peter C. %B ETS %D 2007 %I IEEE Computer Society %K dblp %P 201 %T Wafer Level Reliability Screens. %U http://dblp.uni-trier.de/db/conf/ets/ets2007.html#Maxwell07 %@ 978-0-7695-2827-4

@inproceedings{conf/ets/Maxwell07, added-at = {2023-03-23T00:00:00.000+0100}, author = {Maxwell, Peter C.}, biburl = {https://www.bibsonomy.org/bibtex/2d27a2a1df93b9b96260bea45d1707d9f/dblp}, booktitle = {ETS}, crossref = {conf/ets/2007}, ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2007.45}, interhash = {e4dc1027ea6269907e0e881676e37228}, intrahash = {d27a2a1df93b9b96260bea45d1707d9f}, isbn = {978-0-7695-2827-4}, keywords = {dblp}, pages = 201, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:47:27.000+0200}, title = {Wafer Level Reliability Screens.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2007.html#Maxwell07}, year = 2007 }