%0 Conference Paper %1 conf/ats/MiyaseKR04 %A Miyase, Kohei %A Kajihara, Seiji %A Reddy, Sudhakar M. %B Asian Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 76-81 %T Multiple Scan Tree Design with Test Vector Modification. %U http://dblp.uni-trier.de/db/conf/ats/ats2004.html#MiyaseKR04 %@ 0-7695-2235-1

@inproceedings{conf/ats/MiyaseKR04, added-at = {2023-03-24T00:00:00.000+0100}, author = {Miyase, Kohei and Kajihara, Seiji and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2d00f2eca37a67a410d6b84da7142b3a0/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2004.61}, interhash = {e6ca6dd6876e440639a3dbd971ae00e2}, intrahash = {d00f2eca37a67a410d6b84da7142b3a0}, isbn = {0-7695-2235-1}, keywords = {dblp}, pages = {76-81}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:57.000+0200}, title = {Multiple Scan Tree Design with Test Vector Modification.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2004.html#MiyaseKR04}, year = 2004 }