%0 Journal Article %1 journals/mr/PetitMZSFM05 %A Petit, Christian %A Meinertzhagen, A. %A Zander, Damien %A Simonetti, O. %A Fadlallah, M. %A Maurel, T. %D 2005 %J Microelectron. Reliab. %K dblp %N 3-4 %P 479-485 %T Low voltage SILC and P- and N-MOSFET gate oxide reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#PetitMZSFM05 %V 45

@article{journals/mr/PetitMZSFM05, added-at = {2022-06-17T00:00:00.000+0200}, author = {Petit, Christian and Meinertzhagen, A. and Zander, Damien and Simonetti, O. and Fadlallah, M. and Maurel, T.}, biburl = {https://www.bibsonomy.org/bibtex/206c7d8fa1de0ea5ec6745f8822952276/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.08.002}, interhash = {ea5b15a2555bbf219ed990229541313c}, intrahash = {06c7d8fa1de0ea5ec6745f8822952276}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {3-4}, pages = {479-485}, timestamp = {2024-04-09T02:48:44.000+0200}, title = {Low voltage SILC and P- and N-MOSFET gate oxide reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#PetitMZSFM05}, volume = 45, year = 2005 }