Abstract
A combination of in-situ stress measurements with low-energy electron
diffraction and scanning tunneling microscopy is used to investigate
structural transitions during film growth. The formation of misfit
distortions during the growth of Fe on W(110) and the formation of
different coincidence structures for the growth of Ni on W(110) are
identified with high sensitivity by characteristic changes in the
stress versus coverage curves. The influence of structural changes
on the magnetic properties of Fe films is examined with magneto-optical
Kerr effect measurements.
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