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- BibTeX key
- NAKA2007
- entry type
- book
- year
- 2007
- publisher
- Springer Verlag London
- owner
- plankensteiner
- url
- http://books.google.at/books?hl=de&lr=&id=ZZPpOz4egyoC&oi=fnd&pg=PA1&dq=semiconductor+lifetime+cumulative+damage+model&ots=x4Wbot1ZA0&sig=XlKOz0AOsbAwOIUGzrgfGxWKx-I#v=onepage&q&f=false
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- please select -%0 Book
%1 NAKA2007
%A Nakagawa, Toshiba
%D 2007
%I Springer Verlag London
%K imported
%T Shock and Damage Models in Reliability Theory
%U http://books.google.at/books?hl=de&lr=&id=ZZPpOz4egyoC&oi=fnd&pg=PA1&dq=semiconductor+lifetime+cumulative+damage+model&ots=x4Wbot1ZA0&sig=XlKOz0AOsbAwOIUGzrgfGxWKx-I#v=onepage&q&f=false
@book{NAKA2007,
added-at = {2013-01-07T16:10:56.000+0100},
author = {Nakagawa, Toshiba},
biburl = {https://www.bibsonomy.org/bibtex/29b5dc16b75e5e69916d20c5647dca835/olivia.bluder},
interhash = {fd31548d8c479ee3139d29fb07d01dde},
intrahash = {9b5dc16b75e5e69916d20c5647dca835},
keywords = {imported},
owner = {plankensteiner},
publisher = {Springer Verlag London},
timestamp = {2013-01-07T16:10:56.000+0100},
title = {Shock and Damage Models in Reliability Theory},
url = {http://books.google.at/books?hl=de&lr=&id=ZZPpOz4egyoC&oi=fnd&pg=PA1&dq=semiconductor+lifetime+cumulative+damage+model&ots=x4Wbot1ZA0&sig=XlKOz0AOsbAwOIUGzrgfGxWKx-I#v=onepage&q&f=false},
year = 2007
}