%0 Conference Paper %1 conf/ats/DattaBMR05 %A Datta, Animesh %A Bhunia, Swarup %A Mukhopadhyay, Saibal %A Roy, Kaushik %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 170-175 %T A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#DattaBMR05 %@ 0-7695-2481-8

@inproceedings{conf/ats/DattaBMR05, added-at = {2024-05-07T00:00:00.000+0200}, author = {Datta, Animesh and Bhunia, Swarup and Mukhopadhyay, Saibal and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2ab023f00eb9a7bcaf03dfced5ad0cff2/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.16}, interhash = {fec007ac7bada1b427474544c9cf0daa}, intrahash = {ab023f00eb9a7bcaf03dfced5ad0cff2}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {170-175}, publisher = {IEEE Computer Society}, timestamp = {2024-05-13T08:33:56.000+0200}, title = {A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#DattaBMR05}, year = 2005 }