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Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity., , , , , , , и . ISCAS (1), стр. 110-113. IEEE, (1999)Effect-cause intra-cell diagnosis at transistor level., , , , , , и . ISQED, стр. 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing., , , , , и . VLSI-SoC, стр. 403-408. IEEE, (2006)Energy Model based Control for Forming Processes., и . ICINCO-ICSO, стр. 51-59. INSTICC Press, (2008)Example-based programming: a pertinent visual approach for learning to program., , и . AVI, стр. 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation., , и . IHM, том 264 из ACM International Conference Proceeding Series, стр. 147-154. ACM, (2005)Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications., , , , , , , и . ATS, стр. 55-60. IEEE, (2019)From onions to broccoli: generalizing Lewis' counterfactual logic.. J. Appl. Non Class. Logics, 17 (2): 213-229 (2007)Towards approximation during test of Integrated Circuits., , , , , и . DDECS, стр. 28-33. IEEE, (2017)Fast Bridging Fault Diagnosis using Logic Information., , , , , и . ATS, стр. 33-38. IEEE, (2007)