( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Static Test Compaction for Functional Test Sequences With Restoration of Functional Switching Activity.

. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (10): 1755-1762 (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Irith Baumann

Irith Wiegand

Irith Bittmann

Alexander Pomeranz

Irith Bittmann

 

Другие публикации лиц с тем же именем

Multicycle Tests With Fault Detection Test Data for Improved Logic Diagnosis.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (5): 1587-1591 (2022)Pass/Fail Data for Logic Diagnosis Under Bounded Transparent Scan.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 4862-4872 (2022)Maximal Independent Fault Set for Gate-Exhaustive Faults.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (3): 598-602 (2021)Storage-Based Logic Built-in Self-Test With Multicycle Tests.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3553-3557 (2022)Vector-restoration-based static compaction using random initial omission., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (11): 1587-1592 (2004)Storage-Based Logic Built-In Self-Test with Variable-Length Test Data.. DFT, стр. 1-6. IEEE, (2022)Input Test Data Volume Reduction Using Seed Complementation and Multiple LFSRs.. VTS, стр. 1-6. IEEE, (2020)Functional Broadside Tests with Minimum and Maximum Switching Activity., и . J. Low Power Electron., 4 (3): 429-437 (2008)Semiconcurrent Online Testing of Transition Faults through Output Response Comparison of Identical Circuits., и . IEEE Trans. Dependable Secur. Comput., 6 (3): 231-240 (2009)Worst-case and average-case analysis of n-detection test sets and test generation strategies., и . IET Comput. Digit. Tech., 1 (4): 353-363 (2007)