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Road to commercialize ArF technology for Si photonics through wafer-level assessment.

, , , , , , , и . OFC, стр. 1-3. IEEE, (2015)

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Entropy Based Test Cases Reduction Algorithm for User Session Based Testing., и . ICGEC (2), том 388 из Advances in Intelligent Systems and Computing, стр. 365-373. Springer, (2015)People Counting with Extended Convolutional Neural Network., и . ICCTA, стр. 99-104. IEEE, (2017)People Counting System with C-Deep Feature in Dense Crowd Views., и . ICIS, стр. 451-456. IEEE Computer Society, (2018)Road to commercialize ArF technology for Si photonics through wafer-level assessment., , , , , , , и . OFC, стр. 1-3. IEEE, (2015)Improving Branch Coverage for White-box Testing., и . ICCTA, стр. 63-68. IEEE, (2017)Finding the Extreme Values with some Application of Derivatives. International Journal of Trend in Scientific Research and Development, 3 (6): 1149-1152 (октября 2019)