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A Greedy Heuristic for Locating Crossovers in Conveyor-based AMHS in Wafer Fabs.

, , , , и . WSC, стр. 1667-1676. IEEE, (2009)

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Danai Dima

Investigation of neural correlates of bottom-up and top-down processing with functional magnetic resonance imaging and electroencephalogram: exemplified by the binocular depth inversion-paradigm. TierH Hannover, (2009)

Jamal Nazzal

Rewa Nazzal

Saleh Nazzal

Dima Ghanam

 

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