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Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's.

, и . FPGA, стр. 17-23. ACM, (1997)

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H Glenn Penny

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Statistical identification and analysis of defect development in digital imagers., , , и . Digital Photography, том 7250 из SPIE Proceedings, стр. 72500. SPIE, (2009)Fault Tolerance for Islandable-Microgrid Sensors., и . DFT, стр. 1-4. IEEE, (2021)Hot Pixel Behavior as Pixel Size Reduces to 1 micron., , , и . IMSE, стр. 39-45. Society for Imaging Science and Technology, (2017)Correcting high-density hot pixel defects in digital imagers., , , и . IMSE, том 9022 из SPIE Proceedings, стр. 90220G. SPIE, (2014)Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO., , , и . Sensors, Cameras, and Systems for Industrial and Scientific Applications, том 8659 из SPIE Proceedings, стр. 86590C. SPIE, (2013)Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip., , и . DFT, стр. 3-10. IEEE Computer Society, (2001)Experimental study and analysis of soft and permanent errors in digital cameras., , , , и . DFT, стр. 11-14. IEEE Computer Society, (2016)Laser Processes for Defect Correction in Large Area VLSI Systems.. DFT, стр. 106-114. IEEE Computer Society, (1994)Post arrays for the immobilization of vapochromic coordination polymers for chemical sensors., , , , и . IEEE SENSORS, стр. 1-3. IEEE, (2017)Subsurface Bioimaging using Angular Domain Optical Backscattering Illumination., , , и . EMBC, стр. 1932-1936. IEEE, (2006)