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Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs.

, , , , и . ITC, стр. 1-6. IEEE, (2018)

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Hayk Shoukourian

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K Schaber

 

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An approach for system tests design and its application., , , и . VTS, стр. 448-453. IEEE Computer Society, (1995)Automated flow for test pattern creation for IPs in SoC., , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2017)An efficient testing methodology for embedded flash memories., , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2017)An efficient approach for memory repair by reducing the number of spares., , , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2015)Generic BIST architecture for testing of content addressable memories., , , , и . IOLTS, стр. 86-91. IEEE Computer Society, (2011)Alternative Combination of Processes., и . PDPTA, стр. 576-582. CSREA Press, (2006)Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (3): 562-575 (2019)An Approach for Access Differentiation Design in Medical Distributed Applications Built on Databases., , , и . MIE, том 68 из Studies in Health Technology and Informatics, стр. 78-82. IOS Press, (1999)Impact of process variations on read failures in SRAMs., , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2013)An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters., , , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2013)