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Machine Intelligence for Efficient Test Pattern Generation.

, , и . ITC, стр. 1-5. IEEE, (2020)

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Robert Spencer

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Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training., , , и . ATS, стр. 13-18. IEEE, (2019)Machine Intelligence for Efficient Test Pattern Generation., , и . ITC, стр. 1-5. IEEE, (2020)CryptIP: An Approach for Encrypting Intellectual Property Cores with Simulation Capabilities., , и . VLSID, стр. 92-97. IEEE Computer Society, (2014)Simulating and Evaluating a Quaternary Logic FPGA Based on Floating-gate Memories and Voltage Division., , , и . FPGA, стр. 226. ACM, (2021)A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits., и . VLSID, стр. 20-25. IEEE Computer Society, (2014)Linear Programming Formulations for Thermal-Aware Test Scheduling of 3D-Stacked Integrated Circuits., и . Asian Test Symposium, стр. 37-42. IEEE Computer Society, (2012)Unsupervised Learning in Test Generation for Digital Integrated Circuits., , и . ETS, стр. 1-4. IEEE, (2021)A Pragmatic Quaternary FPGA Implemented with Floating Gate Memories., , , и . ISMVL, стр. 166-171. IEEE, (2021)Special Session: Delay Fault Testing - Present and Future., , , и . VTS, стр. 1-10. IEEE, (2019)Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits., , и . VTS, стр. 1-14. IEEE, (2021)