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Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge.

, , , , и . IEEE Trans. Ind. Electron., 70 (5): 5214-5223 (2023)

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Junfeng Luo

Jia Luo

Yongxiang Luo

Xiaoguang Luo

Liangping Luo

 

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