From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

SRAM Array Structures for Energy Efficiency Enhancement., и . IEEE Trans. Circuits Syst. II Express Briefs, 60-II (6): 351-355 (2013)NBTI/PBTI-Aware WWL Voltage Control for Half-Selected Cell Stability Improvement., , , и . IEEE Trans. Circuits Syst. II Express Briefs, 60-II (9): 602-606 (2013)A Self-Adaptive Time-Based MPPT With 96.2% Tracking Efficiency and a Wide Tracking Range of 10 µA to 1 mA for IoT Applications., , , и . IEEE Trans. Circuits Syst. I Regul. Pap., 64-I (9): 2334-2345 (2017)An Area Efficient 1024-Point Low Power Radix-22 FFT Processor With Feed-Forward Multiple Delay Commutators., и . IEEE Trans. Circuits Syst. I Regul. Pap., 65-I (10): 3291-3299 (2018)Guest Editorial Special Issue on Selected Papers From ISCAS 2021., , и . IEEE Trans. Biomed. Circuits Syst., 15 (6): 1126-1128 (2021)A 0.4 V 12T 2RW dual-port SRAM with suppressed common-row-access disturbance., , и . Microelectron. J., (2017)A Reconfigurable 4T2R ReRAM Computing In-Memory Macro for Efficient Edge Applications., , , и . IEEE Open J. Circuits Syst., (2021)0.77 fJ/bit/search Content Addressable Memory Using Small Match Line Swing and Automated Background Checking Scheme for Variation Tolerance., , , , , и . IEEE J. Solid State Circuits, 49 (7): 1487-1498 (2014)Impacts of NBTI/PBTI on SRAM VMIN and design techniques for SRAM VMIN improvement., и . ISOCC, стр. 163-166. IEEE, (2011)On-chip reliability monitors for measuring circuit degradation., , , и . Microelectron. Reliab., 50 (8): 1039-1053 (2010)