( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Comprehensive Characterization of Cancer Driver Genes and Mutations

, , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , и . Cell, 173 (2): 371-385 (апреля 2018)
DOI: 10.1016/j.cell.2018.02.060

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

W Müller

W Löwa

W Voigt

W Warsch

W Schimmack

 

Другие публикации лиц с тем же именем

Comprehensive Characterization of Cancer Driver Genes and Mutations, , , , , , , , , и 37 other автор(ы). Cell, 173 (2): 371-385 (апреля 2018)Consistency of modified Fisher prediction function. Journal of Statistical Planning and Inference, (1987)Label-Free Fiber Optic Biosensors With Enhanced Sensitivity, , , , и . (2007)Research on Authentication and Key Agreement Protocol of Smart Medical Systems Based on Blockchain Technology., , , и . ICA3PP (2), том 13156 из Lecture Notes in Computer Science, стр. 439-452. Springer, (2021)Multiple Buckling and Codimension-Three Bifurcation Phenomena of a Nonlinear Oscillator., , , , и . Int. J. Bifurc. Chaos, (2014)NVDimm-FE: A High-density 3D Architecture of 3-bit/c 2TnCFE to Break Great Memory Wall with 10 ns of PGM-pulse, 1010 Cycles of Endurance, and Decade Lifetime at 103 °C., , , , , , , , , и . VLSI Technology and Circuits, стр. 359-360. IEEE, (2022)Low-temperature ordering of (001) granular FePt films by inserting ultrathin SiOsub 2 layers, , и . Applied Physics Letters, 91 (7): 072502+ (2007)A Novel Parallel Algorithm for Enumerating Combinations., , , и . ICPP, Vol. 2, стр. 70-73. IEEE Computer Society, (1996)0-8186-7623-X.Investigation of Voltage Stability Indices to Identify Weakest Bus (TBC)., , , , и . MobiMedia, том 77 из Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, стр. 682-687. Springer, (2010)FAE: Autoencoder-Based Failure Binning of RTL Designs for Verification and Debugging., , , и . ITC, стр. 1-10. IEEE, (2019)