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International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia.

, , , , и . ITC, стр. 1-4. IEEE, (2019)

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Panel Session - Vertical integration versus disaggregation.. DATE, стр. 602. IEEE, (2009)System chip test: how will it impact your design?, и . DAC, стр. 136-141. ACM, (2000)Challenges in testing core-based system ICs., и . IEEE Commun. Mag., 37 (6): 104-109 (1999)On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI., , , , и . ETS, стр. 1-4. IEEE, (2023)SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor., , , , и . ITC, стр. 388-392. IEEE, (2023)Some Experiments in Test Pattern Generation for FPGA-Implemented Combinational Circuits., , , , и . SBCCI, стр. 3-8. IEEE Computer Society, (2000)Test Pattern and Test Configuration Generation Methodology for the Logic of RAM-Based FPGA., , , и . Asian Test Symposium, стр. 254-. IEEE Computer Society, (1997)Embedded tutorial: TRP: integrating embedded test and ATE., , , , , , , , и . DATE, стр. 34-37. IEEE Computer Society, (2001)Securing test infrastructure of system-on-chips., , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2016)Experimental study on Hamming and Hsiao codes in the context of embedded applications., , , и . EWDTS, стр. 1-4. IEEE Computer Society, (2017)