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Другие публикации лиц с тем же именем

Low-power memory repair for high defect densities., и . IOLTS, стр. 171-173. IEEE, (2015)Design of Static CMOS Self-Checking Circuits using Built-In Current Sensing., , и . FTCS, стр. 104-111. IEEE Computer Society, (1992)Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs., , , и . ETS, стр. 1-6. IEEE, (2017)Fault-Secure Parity Prediction Booth Multipliers., и . IEEE Des. Test Comput., 16 (3): 90-101 (1999)Dynamic Data-bit Memory Built-In Self- Repair., , и . ICCAD, стр. 588-594. IEEE Computer Society / ACM, (2003)Variability-aware and fault-tolerant self-adaptive applications for many-core chips., , , и . ETS, стр. 1. IEEE Computer Society, (2013)Hot topic session 4A: Reliability analysis of complex digital systems., , , , и . VTS, стр. 1. IEEE Computer Society, (2013)Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors., , и . VTS, стр. 371-376. IEEE Computer Society, (2008)Efficient UBIST implementation for microprocessor sequencing parts.. ITC, стр. 316-326. IEEE Computer Society, (1990)Scaling Deeper to Submicron: On-Line Testing to the Rescue., и . DATE, стр. 432-. IEEE Computer Society / ACM, (1999)