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Industrial best practice: cases of study by automotive chip- makers., , , , , , , , , и 2 other автор(ы). DFT, стр. 1-6. IEEE, (2021)Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip., , , , , , , , , и . ETS, стр. 1-6. IEEE, (2022)A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip., , , , , , , , , и 1 other автор(ы). ETS, стр. 1-6. IEEE, (2019)Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip., , , , , , , и . ETS, стр. 1-6. IEEE, (2023)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , и 11 other автор(ы). IOLTS, стр. 1-10. IEEE, (2022)Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening., , , , , , и . ITC, стр. 1-7. IEEE Computer Society, (2014)