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Statistical SRAM analysis for yield enhancement.

, , , , и . DATE, стр. 57-62. IEEE Computer Society, (2010)

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Paul Zuber

Walter Zuber

Hubert Zuber

Walter Zuber

Uwe Zuber

 

Другие публикации лиц с тем же именем

Exploiting Metal Layer Characteristics for Low-Power Routing., , и . PATMOS, том 2451 из Lecture Notes in Computer Science, стр. 55-64. Springer, (2002)Statistical SRAM analysis for yield enhancement., , , , и . DATE, стр. 57-62. IEEE Computer Society, (2010)Variability Aware Sub-Wavelength Lithography Characterization for Robust SRAM Design., , и . ARCS Workshops, VDE-Verlag, (2011)New reliability mechanisms in memory design for sub-22nm technologies., , , , , , , , , и 7 other автор(ы). IOLTS, стр. 111-114. IEEE Computer Society, (2011)A wire load model considering metal layer properties., , , , и . ICECS, стр. 765-768. IEEE, (2002)A holistic approach for statistical SRAM analysis., , и . DAC, стр. 717-722. ACM, (2010)Optimization Potential of CMOS Power by Wire Spacing., , и . GI Jahrestagung (1), том P-67 из LNI, стр. 344-348. GI, (2005)Variability aware modeling of SoCs: From device variations to manufactured system yield., , , , , , и . ISQED, стр. 547-553. IEEE Computer Society, (2009)TEASE: a systematic analysis framework for early evaluation of FinFET-based advanced technology nodes., , , , , , , , , и 2 other автор(ы). DAC, стр. 24:1-24:6. ACM, (2013)Exponent Monte Carlo for Quick Statistical Circuit Simulation., , , , и . PATMOS, том 5953 из Lecture Notes in Computer Science, стр. 36-45. Springer, (2009)