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Testing and Reliability Enhancement of Security Primitives., , , , , , , , и . DFT, стр. 1-8. IEEE, (2021)A Novel Modeling-Attack Resilient Arbiter-PUF Design., , , и . VLSID, стр. 123-128. IEEE, (2021)Challenges in Generating True Random Numbers Considering the Variety of Corners, Aging, and Intentional Attacks., , , , и . ICICDT, стр. 10-15. IEEE, (2023)DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors., , , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (3): 774-787 (марта 2024)On the Practicality of Relying on Simulations in Different Abstraction Levels for Pre-silicon Side-Channel Analysis., , , , , и . SECRYPT, стр. 661-668. SCITEPRESS, (2022)Leakage Power Analysis in Different S-Box Masking Protection Schemes., , , , и . DATE, стр. 1263-1268. IEEE, (2022)Robust and Efficient Data Security Solution for Pervasive Data Sharing in IoT., , , и . CCNC, стр. 775-781. IEEE, (2022)Security Order of Gate-Level Masking Schemes., , , , и . HOST, стр. 57-67. IEEE, (2023)Reducing Aging Impacts in Digital Sensors via Run-Time Calibration., , , , и . J. Electron. Test., 37 (5): 653-673 (2021)On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability., , , , , и . ICCD, стр. 506-509. IEEE, (2020)