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RISC-V Processor Trace Encoder with Multiple Instructions Retirement Support., , , и . VLSI-SoC, стр. 1-6. IEEE, (2022)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , и 5 other автор(ы). Microprocess. Microsystems, 39 (8): 1039-1051 (2015)The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , и 5 other автор(ы). ESSDERC, стр. 218-225. IEEE, (2015)Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology., , , , , , , , , и . ISQED, стр. 473-479. IEEE, (2014)Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , и . DATE, стр. 1-6. European Design and Automation Association, (2014)Bias temperature instability analysis in SRAM decoder., , , , и . ETS, стр. 1. IEEE Computer Society, (2013)Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation., , , и . IEEE Trans. Consumer Electronics, 55 (3): 1645-1653 (2009)BTI impact on logical gates in nano-scale CMOS technology., , , , и . DDECS, стр. 348-353. IEEE, (2012)Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation., , , , , , , , , и 7 other автор(ы). IRPS, стр. 1-6. IEEE, (2024)A high performance reconfigurable Motion Estimation hardware architecture., , , и . DATE, стр. 882-885. IEEE, (2009)