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Positive charge trapping phenomenon in n-channel thin-film transistors with amorphous alumina gate insulators

, , , , , , , , и . Journal of Applied Physics, 120 (24): 244501 (декабря 2016)
DOI: 10.1063/1.4972475

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Mathieu Luisier

Theodor Mathieu

Ilse Mathieu

Bernd Mathieu

Herbert Mathieu

 

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