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Fault Modeling and Test Algorithm Development.

, , и . ITC, стр. 343-352. IEEE Computer Society, (1988)

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Loek Geeraedts

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Другие публикации лиц с тем же именем

A realistic fault model and test algorithms for static random access memories., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 9 (6): 567-572 (1990)Fault Modeling and Test Algorithm Development., , и . ITC, стр. 343-352. IEEE Computer Society, (1988)A Realistic Self-Test Machine for Static Random Access Memories., , и . ITC, стр. 353-361. IEEE Computer Society, (1988)Functional and IDDQ testing on a static RAM., , , и . ITC, стр. 929-937. IEEE Computer Society, (1990)Minimizing Test Time by Exploiting Parallelism in Macro Test., , , , , и . ITC, стр. 451-460. IEEE Computer Society, (1993)