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A Deep Learning framework for simulation and defect prediction applied in microelectronics., , , , , , и . Simul. Model. Pract. Theory, (2020)Anomaly Detection in Aluminium Production with Unsupervised Machine Learning Classifiers., , , и . INISTA, стр. 1-6. IEEE, (2019)Intelligent Information Management System for Decision Support: Application in a Lift Manufacturer's Shop Floor., , , , , , , , и . INISTA, стр. 1-6. IEEE, (2019)Data Analytics Platform for the Optimization of Waste Management Procedures., , , , , , и . DCOSS, стр. 333-338. IEEE, (2019)Towards the behavior analysis of chemical reactors utilizing data-driven trend analysis and machine learning techniques., , , , , , и . Appl. Soft Comput., (2020)Malfunction diagnosis in industrial process systems using data mining for knowledge discovery., , , , , , и . ICE/ITMC, стр. 454-461. IEEE, (2017)Occupancy Inference Through Energy Consumption Data: A Smart Home Experiment., , , , , и . ICVS, том 11754 из Lecture Notes in Computer Science, стр. 670-679. Springer, (2019)Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans., , , , , , и . IEEE Trans. Ind. Electron., 67 (7): 5748-5757 (2020)Robust malfunction diagnosis in process industry time series., , , , , и . INDIN, стр. 111-116. IEEE, (2016)Evaluation of Linear Trend Tests Using Resampling Techniques., , и . Communications in Statistics - Simulation and Computation, 37 (5): 907-923 (2008)