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Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels.

, , , , и . DFT, стр. 1-6. IEEE Computer Society, (2018)

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Luise Klinsmann

Joachim Klinsmann

Rolando Meneses

Julio Coelho

Vânia Coelho

 

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Dependence of SEUs in Digital Cameras on Pixel size and Elevation., , , , и . DFT, стр. 1-4. IEEE, (2021)Image Degradation in Time Due to Interacting Hot Pixels., , , , и . DFT, стр. 1-6. IEEE, (2023)Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels., , , , и . DFT, стр. 1-6. IEEE Computer Society, (2018)Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation., , , , , и . DFT, стр. 1-4. IEEE, (2020)Image Degradation due to Interacting Adjacent Hot Pixels., , , и . DFT, стр. 1-6. IEEE, (2022)Image degradation from hot pixel defects with pixel size shrinkage., , , , и . IMSE, стр. 1-7. Society for Imaging Science and Technology, (2019)Detecting SEUs in Noisy Digital Imagers with small pixels., , , , , , и . DFT, стр. 1-6. IEEE, (2019)Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels., , , , , и . IMSE, стр. 1-6. Society for Imaging Science and Technology, (2018)Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes., , , , , , и . IMSE, стр. 1-6. Society for Imaging Science and Technology, (2016)Single Event Upsets and Hot Pixels in digital imagers., , , , , , и . DFTS, стр. 41-46. IEEE Computer Society, (2015)