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Chopper-Stabilized Low-Noise Multipath Operational Amplifier With Dual Ripple Rejection Loops.

H. Kim, K. Han, J. Kim, D. You, H. Heo, Y. Kwon, C. Kim, H. Lee, и H. Ko. IEEE Trans. Circuits Syst., 67-II (11): 2427-2431 (2020)

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Yeong Deok Lee

Min-Hi Lee

Induction and regulation of antiviral defence mechanisms through intracytoplasmic sensorsM. Lee. HU Berlin, (2009)

Bong-Hi Lee

Duk Hi Lee

Choung-Hi Lee

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Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO2 and S3N4 as Trapping Layer.S. Lee, S. Yang, J. Oh, H. Yun, K. Jeong, Y. Kim, H. Lee, и G. Lee. IEICE Trans. Electron., 95-C (5): 831-836 (2012)Epitaxial Strain Control of HfxZr1-xO2 with Sub-nm IGZO Seed Layer Achieving EOT=0.44 nm for DRAM Cell Capacitor.S. Kim, Y. Park, G. Lee, E. Shin, W. Ko, H. Lee, G. Lee, и B. Cho. VLSI Technology and Circuits, стр. 1-2. IEEE, (2023)Chopper-Stabilized Low-Noise Multipath Operational Amplifier With Dual Ripple Rejection Loops.H. Kim, K. Han, J. Kim, D. You, H. Heo, Y. Kwon, C. Kim, H. Lee, и H. Ko. IEEE Trans. Circuits Syst., 67-II (11): 2427-2431 (2020)Bottom-Gated ZnO TFT Pressure Sensor with 1D Nanorods.K. Kim, W. Ko, J. Byun, D. Lee, J. Jeong, H. Lee, и G. Lee. Sensors, 22 (22): 8907 (2022)SONOS-Type Flash Memory with HfO2 Thinner than 4 nm as Trapping Layer Using Atomic Layer Deposition.J. Oh, K. Choi, Y. Kim, M. Kang, M. Song, S. Lim, D. Yoo, J. Park, H. Lee, и G. Lee. IEICE Trans. Electron., 93-C (5): 590-595 (2010)Thermally Robust Nickel Silicide Process for Nano-Scale CMOS Technology.S. Oh, J. Yun, B. Huang, Y. Kim, H. Ji, S. Huh, H. Cha, U. Kim, J. Wang, и H. Lee. IEICE Trans. Electron., 88-C (4): 651-655 (2005)Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs.J. Jang, H. Kwon, H. Kwak, S. Kwon, S. Hwang, J. Shin, S. Sung, Y. Chung, D. Lee, и H. Lee. IEICE Trans. Electron., 96-C (5): 624-629 (2013)Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging.H. Song, S. Eadi, H. Song, H. Choi, G. Lee, и H. Lee. IRPS, стр. 1-4. IEEE, (2020)Reliability Analysis by Charge Migration of 3D SONOS Flash Memory.J. Jeong, J. Sung, H. Yang, H. Lee, и G. Lee. IRPS, стр. 1-5. IEEE, (2020)Low-Noise Chopper Amplifier Using Lateral PNP Input Stage With Automatic Base Current Cancellation.H. Kim, Y. Kwon, D. You, H. Choi, S. Kim, H. Heo, C. Kim, H. Lee, и H. Ko. IEEE Trans. Circuits Syst. II Express Briefs, 68 (7): 2297-2301 (2021)

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