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Effect-cause intra-cell diagnosis at transistor level., , , , , , и . ISQED, стр. 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing., , , , , и . VLSI-SoC, стр. 403-408. IEEE, (2006)Energy Model based Control for Forming Processes., и . ICINCO-ICSO, стр. 51-59. INSTICC Press, (2008)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity., , , , , , , и . ISCAS (1), стр. 110-113. IEEE, (1999)Example-based programming: a pertinent visual approach for learning to program., , и . AVI, стр. 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation., , и . IHM, том 264 из ACM International Conference Proceeding Series, стр. 147-154. ACM, (2005)Towards approximation during test of Integrated Circuits., , , , , и . DDECS, стр. 28-33. IEEE, (2017)Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments., , , , , , и . IEEE Trans. Aerosp. Electron. Syst., 59 (3): 2885-2897 (июня 2023)Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata., , , , , , и . IEEE Trans. Circuits Syst. II Express Briefs, 70 (6): 2256-2260 (июня 2023)A Ring Architecture Strategy for BIST Test Pattern Generation., , , и . J. Electron. Test., 19 (3): 223-231 (2003)