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Multiprocessing memory subsystem., и . Microprocess. Microsystems, 11 (7): 357-364 (1987)An Industrial Evaluation of DRAM Tests.. IEEE Des. Test Comput., 21 (5): 430-440 (2004)Automatic fault localization at chip level., , и . Microprocess. Microsystems, 22 (1): 13-22 (1998)An Overview of Deterministic Functional RAM Chip Testing., и . ACM Comput. Surv., 22 (1): 5-33 (1990)Special architecture for high-performance scan conversion., и . Microprocessing and Microprogramming, 30 (1-5): 431-438 (1990)Speech synthesis system with unlimited vocabulary for the Dutch language., и . Microprocess. Microprogramming, 24 (1-5): 325-333 (1988)Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation., , и . Asian Test Symposium, стр. 185-191. IEEE Computer Society, (1999)Static and dynamic behavior of memory cell array opens and shorts in embedded DRAMs., и . DATE, стр. 496-503. IEEE Computer Society, (2001)Minimal Test for Coupling Faults in Word-Oriented Memories., , и . DATE, стр. 944-948. IEEE Computer Society, (2002)Disturb Neighborhood Pattern Sensitive Fault., и . VTS, стр. 37-47. IEEE Computer Society, (1997)