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Accurate and efficient analytical electrical model of antenna for NFC applications., , , , , , , и . NEWCAS, стр. 1-4. IEEE, (2013)Which metrics to use for RF indirect test strategy?, , , , , и . SMACD, стр. 73-76. IEEE, (2019)Estimating Static Parameters of A-to-D Converters from Spectral Analysis., , , , , и . LATW, стр. 174-179. IEEE, (2002)Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions., , , , , и . ETS, стр. 1-2. IEEE, (2017)Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies., , , , и . J. Electron. Test., 33 (4): 515-527 (2017)ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator., , , , , , и . VLSI Design, (2008)A-to-D converters static error detection from dynamic parameter measurement., , , , и . Microelectron. J., 34 (10): 945-953 (2003)Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements., , , , , и . Microelectron. J., 45 (3): 336-344 (2014)A New Methodology For ADC Test Flow Optimization., , , , и . ITC, стр. 201-209. IEEE Computer Society, (2003)MIRID: Mixed-Mode IR-Drop Induced Delay Simulator., , , , , и . Asian Test Symposium, стр. 177-182. IEEE Computer Society, (2013)