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Particulate matter levels in a South American megacity: the metropolitan area of Lima-Callao, Peru

J. Silva, J. Rojas, M. Norabuena, C. Molina, R. Toro, и M. Leiva-Guzmán. Environmental Monitoring and Assessment, 189 (12): 635 (2017)
DOI: 10.1007/s10661-017-6327-2

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Celson José Silva

Alexandre José Silva

António José Silva

José Frederico Straggiotti Silva

Floriano José Silva Neto

Другие публикации лиц с тем же именем

A Sixth-Order 200 MHz IF Bandpass Sigma-Delta Modulator With Over 68 dB SNDR in 10 MHz Bandwidth.C. Lu, J. Silva-Rivas, P. Kode, J. Silva-Martínez, и S. Hoyos. IEEE J. Solid State Circuits, 45 (6): 1122-1136 (2010)ADC testing using joint time-frequency analysis.H. Mendonça, J. da Silva, и J. Matos. Comput. Stand. Interfaces, 23 (2): 129-135 (2001)Evaluation of iDD/vOUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits.J. da Silva, и J. Matos. ED&TC, стр. 264-269. IEEE Computer Society, (1996)A processor for testing mixed-signal cores in System-on-Chip.F. Duarte, J. da Silva, J. Alves, G. Pinho, и J. Matos. DSD, стр. 184-191. IEEE Computer Society, (2005)Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits.J. da Silva, J. Matos, I. Bell, и G. Taylor. J. Electron. Test., 9 (1-2): 75-88 (1996)Mixed-Signal Board Level DfT Techniques Using IEEE P1149.4.J. Matos, и J. da Silva. ICECS, стр. 441-446. IEEE, (1998)Implementation of Mixed Current/Voltage Testing Using the IEEE P1149.4 Infrastructure.J. da Silva, A. Leão, J. Matos, и J. Alves. ITC, стр. 509-517. IEEE Computer Society, (1997)An Approach to Testability Improvement of Mixed-Signal Boards.J. Matos, J. Ferreira, A. Leão, и J. da Silva. ISCAS, стр. 161-164. IEEE, (1994)Architecture of test support ICs for mixed-signal testing.J. Matos, J. Ferreira, A. Leão, и J. da Silva. VTS, стр. 240-246. IEEE Computer Society, (1994)Mixed-Signal BIST Using Correlation and Reconfigurable Hardware.J. da Silva, J. Duarte, и J. Matos. DATE, стр. 744. IEEE Computer Society / ACM, (2000)

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