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A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT.

, , , и . DFT, стр. 1-6. IEEE, (2020)

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Toshinori Kuwahara

Kōmei Hosokawa

Hirofumi Hosokawa

Roberto Tuyoshi Hosokawa

 

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