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A robust color signal processing with wide dynamic range WRGB CMOS image sensor., , и . Digital Photography, том 7876 из SPIE Proceedings, стр. 78760W. SPIE/IS&T, (2011)A Rapid Prototyping of Real-Time Pattern Generator for Step-and-Scan Lithography Using Digital Micromirror Device., , , , , и . FPT, стр. 305-308. IEEE, (2007)High Speed and Narrow-Bandpass Liquid Crystal Filter for Real-Time Multi Spectral Imaging Systems., , , , , , , , , и . IEICE Trans. Electron., 101-C (11): 897-900 (2018)High Sensitivity and High Readout Speed Electron Beam Detector using Steep pn Junction Si diode for Low Acceleration Voltage., , , , и . IMSE, стр. 14-17. Society for Imaging Science and Technology, (2017)A Preliminary Chip Evaluation toward Over 50Mfps Burst Global Shutter Stacked CMOS Image Sensor., , , и . IMSE, стр. 1-4. Society for Imaging Science and Technology, (2018)A still image encoder based on adaptive resolution vector quantization employing needless calculation elimination architecture., , , , , , и . ASP-DAC, стр. 567-568. ACM, (2003)Circuit level prediction of device performance degradation due to negative bias temperature stress., , , , , , и . Microelectron. Reliab., 47 (6): 930-936 (2007)Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction., , , , и . Microelectron. Reliab., 47 (2-3): 409-418 (2007)Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation., , , , , , и . IRPS, стр. 4-1. IEEE, (2018)Checkered white-RGB color LOFIC CMOS image sensor., , , и . ASP-DAC, стр. 347-348. IEEE, (2010)