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Disambiguierung von "Liu, Lishuai"

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Detecting Defects in Porcelain Postinsulator Coated With Room Temperature Vulcanized Silicone Rubber by Pulsed Thermography.

, , , , und . IEEE Trans. Instrumentation and Measurement, 68 (1): 225-233 (2019)

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Liu Liu

Liu Liu

Liu Liu

Keetsin Liu

Ching Liu

 

Weitere Publikationen von Autoren mit dem selben Namen

Remote Optical Thermography Detection Method and System for Silicone Polymer Insulating Materials Used in Power Industry., , , , , und . IEEE Trans. Instrum. Meas., 69 (8): 5782-5790 (2020)Detecting Defects in Porcelain Postinsulator Coated With Room Temperature Vulcanized Silicone Rubber by Pulsed Thermography., , , , und . IEEE Trans. Instrumentation and Measurement, 68 (1): 225-233 (2019)A Semisupervised Learning Framework for Recognition and Classification of Defects in Transient Thermography Detection., , , , , und . IEEE Trans. Ind. Informatics, 18 (4): 2632-2640 (2022)Health Monitoring of RTV Silicone Rubber Coating on Insulators Based on Multimode Features of Active Infrared Thermography., , , , , , und . IEEE Trans. Instrum. Meas., (2022)Differential Evolution Fitting-Based Optical Step-Phase Thermography for Micrometer Thickness Measurement of Atmospheric Corrosion Layer., , , , und . IEEE Trans. Ind. Informatics, 16 (8): 5213-5222 (2020)Distance Effect in Transient Thermography for Internal Defects Detection in Composites., , , , , , und . IEEE Trans. Instrum. Meas., (2022)Pixel-Level Classification of Pollution Severity on Insulators Using Photothermal Radiometry and Multiclass Semisupervised Support Vector Machine., , , , und . IEEE Trans. Ind. Informatics, 17 (1): 441-449 (2021)Comparison of RTV Coating Thickness Identified by Different Frequency Domain Thermal Characteristics., , , , und . I2MTC, Seite 1-6. IEEE, (2021)Defect Detection of Electrical Insulating Materials Using Optically Excited Transient Thermography and Deep Autoencoder., , , , , und . IEEE Trans. Instrum. Meas., (2023)Photothermal Radar Shearography: A Novel Transient-Based Speckle Pattern Interferometry for Depth-Tomographic Inspection., , , , , und . IEEE Trans. Ind. Informatics, 18 (7): 4352-4360 (2022)