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A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay Sensor.

, , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (12): 2934-2943 (2006)

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Asamanjoy Bhunia

Anirban Bhunia

Krishna Swarup Jauhri

 

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