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An aging-aware flip-flop design based on accurate, run-time failure prediction.

, и . VTS, стр. 294-299. IEEE Computer Society, (2012)

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Jacob Jacob

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Abraham Wilentschuk

Rainer Abraham

Günter Abraham

 

Другие публикации лиц с тем же именем

Research in Reliable VLSI Architectures at the University of Illinois.. FJCC, стр. 890-893. IEEE Computer Society, (1986)Design of Test Pattern Generators for Built-In Test., , и . ITC, стр. 315-319. IEEE Computer Society, (1984)Forward Recovery Using Checkpointing in Parallel Systems., , и . ICPP (1), стр. 272-275. Pennsylvania State University Press, (1990)Abstraction of data path registers for multilevel verification of large circuits., , , и . Great Lakes Symposium on VLSI, стр. 11-14. IEEE, (1994)Design and evaluation of fault tolerance techniques for highly parallel architectures.. Great Lakes Symposium on VLSI, IEEE, (1991)An oscillation-based test structure for timing information extraction., , , и . VTS, стр. 74-79. IEEE Computer Society, (2012)Comparison and Diagnosis of Large Replicated Files., , и . IEEE Trans. Software Eng., 13 (1): 15-22 (1987)A low latency and low power dynamic Carry Save Adder., , , , , , , и . ISCAS (2), стр. 477-480. IEEE, (2004)An Area Efficient On-chip Static IR Drop Detector/Evaluator., , и . ISCAS, стр. 2009-2012. IEEE, (2009)CEDA: Control-Flow Error Detection Using Assertions., и . IEEE Trans. Computers, 60 (9): 1233-1245 (2011)