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Microcomputer-Based, Gracefully Degrading Industrial Controller., и . Fehlertolerierende Rechensysteme, том 214 из Informatik-Fachberichte, стр. 124-133. Springer, (1989)Estimating the effect of single-event upsets on microprocessors., , и . DFT, стр. 185-190. IEEE Computer Society, (2014)AMD EPYC™ 7002 Series - A Processor with Improved Soft Error Resilience.. DSN (Supplements), стр. 33-36. IEEE, (2021)Impact of Deep Submicron Technology on Dependability of VLSI Circuits.. DSN, стр. 205-209. IEEE Computer Society, (2002)Silent Data Corruption - Myth or reality?, , , и . DSN, стр. 108-109. IEEE Computer Society, (2008)Neutron SER Characterization of Microprocessors.. DSN, стр. 754-759. IEEE Computer Society, (2005)Dependability Analysis of a Fault-Tolerant Processor.. PRDC, стр. 63-67. IEEE Computer Society, (2001)Dependability Benchmarking of Computing Systems - Panel Statement., , , , , и . DSN, стр. 400. IEEE Computer Society, (2005)A Fault-Tolerant Microcomputer for Advanced Control: Architecture and Performability Analysis., и . RTSS, стр. 222-228. IEEE Computer Society, (1989)Using Physical and Simulated Fault Injection to Evaluate Error Detection Mechanisms.. PRDC, стр. 186-192. IEEE Computer Society, (1999)