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Другие публикации лиц с тем же именем

Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage., , , и . VLSI Design, стр. 471-478. IEEE Computer Society, (2005)A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture., и . ASP-DAC, стр. 810-816. IEEE Computer Society, (2007)DS-LFSR: A New BIST TPG for Low Heat Dissipation., и . ITC, стр. 848-857. IEEE Computer Society, (1997)ATPG for Heat Dissipation Minimization During Test Application., и . IEEE Trans. Computers, 47 (2): 256-262 (1998)Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns., и . ETS, стр. 125-130. IEEE Computer Society, (2008)Re-configurable embedded core test protocol., , и . ASP-DAC, стр. 234-237. IEEE Computer Society, (2004)XWRC: externally-loaded weighted random pattern testing for input test data compression., , и . ITC, стр. 10. IEEE Computer Society, (2005)Efficient unknown blocking using LFSR reseeding., , и . DATE, стр. 1051-1052. European Design and Automation Association, Leuven, Belgium, (2006)ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values., , , и . ICCD, стр. 147-152. IEEE Computer Society, (2005)Unknown-tolerance analysis and test-quality control for test response compaction using space compactors., , , , и . DAC, стр. 1083-1088. ACM, (2006)