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Fluid and Brownian approximations for an Internet congestion control model., , , и . CDC, стр. 3938-3943. IEEE, (2004)Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs., , , , , , , и . Microelectron. Reliab., 52 (9-10): 1905-1908 (2012)Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC., , , , , , , , и . IRPS, стр. 1-4. IEEE, (2023)Reliability Characterization of HBM featuring $HK+MG$ Logic Chip with Multi-stacked DRAMs., , , , , , , , и . IRPS, стр. 1-7. IEEE, (2023)Reliability Improvement with Optimized BEOL Process in Advanced DRAM., , , , , , , и . IRPS, стр. 1-4. IEEE, (2023)Technology development for the radiation hardening of robots., , , , и . IROS, стр. 1715-1720. IEEE, (1999)Virtual FA Methodology for DRAM: Real-Time Analysis and Risk Assessment Method Using Telemetry., , , , , , , , , и 19 other автор(ы). IRPS, стр. 1-7. IEEE, (2024)Discovery of conjoined charge density waves in the kagome superconductor CsV$_3$Sb$_5$, , , , , , , , , и 11 other автор(ы). Nat. Commun., 13 (6348): 6348 (26.10.2022)https://arxiv.org/abs/2202.13530.