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Digital Calibration of Capacitor Mismatch in Sigma-Delta Modulators.

S. Lee, и Y. Chiu. IEEE Trans. Circuits Syst. I Regul. Pap., 58-I (4): 690-698 (2011)

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Chul Lee

Seung-Chul Tae

Seung-Hyeob Lee

Woo Seung Lee

Seung-Jae Lee

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A 10b 205MS/s 1mm2 90nm CMOS Pipeline ADC for Flat-Panel Display Applications.S. Lee, Y. Jeon, K. Kim, J. Kwon, J. Kim, J. Moon, и W. Lee. ISSCC, стр. 458-615. IEEE, (2007)Performance Evaluation of Adaptive Modulation for Multi-Band OFDM.C. Lee, Y. You, и H. Song. IEICE Trans. Commun., 89-B (6): 1931-1934 (2006)Digital Calibration of Capacitor Mismatch in Sigma-Delta Modulators.S. Lee, и Y. Chiu. IEEE Trans. Circuits Syst. I Regul. Pap., 58-I (4): 690-698 (2011)Nonfullerene Electron Transporting Material Based on Naphthalene Diimide Small Molecule for Highly Stable Perovskite Solar Cells with Efficiency Exceeding 20%J. Su‐Kyo, H. Hyuck, L. Woon, L. Seung‐Chul, L. Seung‐Heon, Y. Woojin, Y. Hoseop, I. Hyuk, K. H., и K. O‐Pil. Advanced Functional Materials, (2018)Airborne FMCW-SAR Signal Processing Using Back-Projection Algorithm Correcting Continuous Motion Effect.S. chul Lee, D. jin Kim, и J. Hwang. IGARSS, стр. 2547-2550. IEEE, (2019)A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor.I. Ji, M. Ha, Y. Choi, S. Lee, C. Yun, и M. Han. Microelectron. J., 39 (6): 908-913 (2008)20.7 An RF-PA supply modulator achieving 83% efficiency and -136dBm/Hz noise for LTE-40MHz and GSM 35dBm applications.J. Paek, Y. Youn, J. Choi, D. Kim, J. Jung, Y. Choo, S. Lee, S. Lee, T. Cho, и I. Kang. ISSCC, стр. 354-355. IEEE, (2016)A - 137 dBm/Hz Noise, 82% Efficiency AC-Coupled Hybrid Supply Modulator With Integrated Buck-Boost Converter.J. Paek, S. Lee, Y. Youn, D. Kim, J. Choi, J. Jung, Y. Choo, S. Lee, J. Han, и T. Cho. IEEE J. Solid State Circuits, 51 (11): 2757-2768 (2016)A 10-bit 400-MS/s 160-mW 0.13-μm CMOS dual-channel pipeline ADC without channel mismatch calibration.S. Lee, K. Kim, J. Kwon, J. Kim, и S. Lee. IEEE J. Solid State Circuits, 41 (7): 1596-1605 (2006)Digital calibration of nonlinear memory errors in sigma-delta ADCsS. Lee. University of Illinois Urbana-Champaign, USA, (2012)

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