W. Yau, D. Kumar, and S. Arjunan. Video and Signal Based Surveillance, 2006. AVSS '06. IEEE International
Conference on, page 63--63. IEEE Computer Society, (November 2006)
M. Adameck, M. Hossfeld, and M. Eich. Proceedings of SPIE -- Volume 5011, Machine Vision Applications in
Industrial Inspection XI, 5011, page 128--139. SPIE, (May 2003)