K. Arulkumaran, M. Deisenroth, M. Brundage, und A. Bharath. (2017)cite arxiv:1708.05866Comment: IEEE Signal Processing Magazine, Special Issue on Deep Learning for Image Understanding (arXiv extended version).
J. Lin, Y. Wang, M. Efron, und G. Sherman. TREC, Volume 500-308 von NIST Special Publication, National Institute of Standards and Technology (NIST), (2014)
J. Lin, M. Efron, G. Sherman, Y. Wang, und E. Voorhees. TREC, Volume 500-319 von NIST Special Publication, National Institute of Standards and Technology (NIST), (2015)