M. Cha, W. Han, G. Lee, M. Kim, und K. Sohn. TREC, Volume 500-319 von NIST Special Publication, National Institute of Standards and Technology (NIST), (2015)
S. Wu, K. Wagholikar, S. Sohn, V. Kaggal, und H. Liu. TREC, Volume 500-296 von NIST Special Publication, National Institute of Standards and Technology (NIST), (2011)