%0 Conference Paper %1 conf/ats/QianS10 %A Qian, Xi %A Singh, Adit D. %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 325-330 %T Distinguishing Resistive Small Delay Defects from Random Parameter Variations. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#QianS10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/QianS10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Qian, Xi and Singh, Adit D.}, biburl = {https://www.bibsonomy.org/bibtex/2b4c0dae82cc1184c0eec277db2ca2ac9/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2010.62}, interhash = {000289feeabeda2954d3315a061654a4}, intrahash = {b4c0dae82cc1184c0eec277db2ca2ac9}, isbn = {978-0-7695-4248-5}, keywords = {dblp}, pages = {325-330}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:56.000+0200}, title = {Distinguishing Resistive Small Delay Defects from Random Parameter Variations.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#QianS10}, year = 2010 }